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[IEEE 2014 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with NSREC 2014) - Paris, France (2014.7.14-2014.7.18)] 2014 IEEE Radiation Effects Data Workshop (REDW) - Neutron Induced Single Event Upset (SEU) Testing of Static Random Access Memory (SRAM) Devices
Tostanoski, Michael J., Deaton, Terrence F., Strayer, Roy E., Goldflam, Rudolf, Fullem, Travis Z.Year:
2014
Language:
english
DOI:
10.1109/redw.2014.7004579
File:
PDF, 979 KB
english, 2014