[IEEE 2014 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with NSREC 2014) - Paris, France (2014.7.14-2014.7.18)] 2014 IEEE Radiation Effects Data Workshop (REDW) - Single Event Effects in Power MOSFETs and IGBTs Due to 14 MeV and 25 meV Neutrons
Lambert, Damien, Desnoyers, Francois, Thouvenot, Didier, Azais, BrunoYear:
2014
Language:
english
DOI:
10.1109/redw.2014.7004592
File:
PDF, 1.89 MB
english, 2014