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Atomistic study of dynamics for metallic filament growth in conductive-bridge random access memory
Qin, Shengjun, Liu, Zhan, Zhang, Guo, Zhang, Jinyu, Sun, Yaping, Wu, Huaqiang, Qian, He, Yu, ZhipingVolume:
17
Year:
2015
Language:
english
Journal:
Phys. Chem. Chem. Phys.
DOI:
10.1039/c4cp04903a
File:
PDF, 2.83 MB
english, 2015