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Dark-field X-ray microscopy for multiscale structural characterization
Simons, H., King, A., Ludwig, W., Detlefs, C., Pantleon, W., Schmidt, S., Snigireva, I., Snigirev, A., Poulsen, H. F.Volume:
6
Language:
english
Journal:
Nature Communications
DOI:
10.1038/ncomms7098
Date:
January, 2015
File:
PDF, 882 KB
english, 2015