![](/img/cover-not-exists.png)
UV–VIS and mid-IR ellipsometer characterization of layers used in OLED devices
E. Hartmann, P. Boher, Ch. Defranoux, L. Jolivet, M.-O. MartinVolume:
110
Year:
2004
Language:
english
Pages:
6
DOI:
10.1016/j.jlumin.2004.08.039
File:
PDF, 345 KB
english, 2004