UV–VIS and mid-IR ellipsometer characterization of layers...

UV–VIS and mid-IR ellipsometer characterization of layers used in OLED devices

E. Hartmann, P. Boher, Ch. Defranoux, L. Jolivet, M.-O. Martin
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Volume:
110
Year:
2004
Language:
english
Pages:
6
DOI:
10.1016/j.jlumin.2004.08.039
File:
PDF, 345 KB
english, 2004
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