Structural refinement of Eu doped CaMgSi2O6 using X-ray...

Journal of Luminescence 2005 Vol. 115; Iss. 1-2

Structural refinement of Eu doped CaMgSi2O6 using X-ray powder diffraction data

Yong-Il Kim, Seung-Hoon Nahm, Won Bin Im, Duk Young Jeon, Duncan H. Gregory
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Volume:
115
Year:
2005
Language:
english
Pages:
6
DOI:
10.1016/j.jlumin.2005.02.006
File:
PDF, 201 KB
english, 2005
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