Defect-related light emission from processed He-implanted...

Journal of Luminescence 2006 Vol. 121; Iss. 2

Defect-related light emission from processed He-implanted silicon

J. Bak-Misiuk, A. Misiuk, P. Romanowski, A. Wnuk, J. Trela
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Volume:
121
Year:
2006
Language:
english
Pages:
4
DOI:
10.1016/j.jlumin.2006.08.028
File:
PDF, 173 KB
english, 2006
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