High-Density and High-Reliability Nonvolatile...

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IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2015

High-Density and High-Reliability Nonvolatile Field-Programmable Gate Array With Stacked 1D2R RRAM Array

Huang, Kejie, Zhao, Rong, He, Wei, Lian, Yong
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Year:
2015
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/TVLSI.2015.2389260
File:
PDF, 3.01 MB
english, 2015
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