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High-resolution, high-throughput imaging with a multibeam scanning electron microscope
EBERLE, A.L., MIKULA, S., SCHALEK, R., LICHTMAN, J., TATE, M.L. KNOTHE, ZEIDLER, D.Volume:
259
Language:
english
Journal:
Journal of Microscopy
DOI:
10.1111/jmi.12224
Date:
August, 2015
File:
PDF, 2.32 MB
english, 2015