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A design methodology for low-leakage and high-performance buffer based on deviant behavior of gate leakage
Yu, Le, Sun, Jiabin, Chen, Zhujia, Wang, Zhaoxin, Zhang, Chao, Yang, HaigangVolume:
31
Language:
english
Journal:
Journal of Electronics (China)
DOI:
10.1007/s11767-014-4033-6
Date:
October, 2014
File:
PDF, 246 KB
english, 2014