Low Energy Electron Diffraction and X-Ray Photoelectron...

Japanese Journal of Applied Physics 1988 / 1 Vol. 27; Iss. Part 1, No

Low Energy Electron Diffraction and X-Ray Photoelectron Spectroscopy Studies of the Formation of Submonolayer Interfaces of Sb/Si(111)

Park, Chong-Yun, Abukawa, Tadashi, Kinoshita, Toyohiko, Enta, Yoshiharu, Kono, Shozo
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Volume:
27
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.27.147
Date:
January, 1988
File:
PDF, 640 KB
1988
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