[IEEE 2014 3rd International Conference on Reliability,...

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[IEEE 2014 3rd International Conference on Reliability, Infocom Technologies and Optimization (ICRITO) (Trends and Future Directions) - Noida, India (2014.10.8-2014.10.10)] Proceedings of 3rd International Conference on Reliability, Infocom Technologies and Optimization - Authentication and tamper detection in images using dual watermarking approach

Saiyyad, Mohmmad Ali M., Patil, Nitin N.
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Year:
2014
Language:
english
DOI:
10.1109/icrito.2014.7014741
File:
PDF, 263 KB
english, 2014
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