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[IEEE 2014 IEEE 12th International Conference on Solid -State and Integrated Circuit Technology (ICSICT) - Guilin, China (2014.10.28-2014.10.31)] 2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - A dynamic reference scheme to improve the sensing reliability of magnetic random access memory
Kang, Wang, Li, Zheng, Cheng, Yuanqing, Klein, Jacques-Olivier, Zhang, Youguang, Ravelosona, Dafine, Chappert, Claude, Zhao, WeishengYear:
2014
Language:
english
DOI:
10.1109/icsict.2014.7021433
File:
PDF, 900 KB
english, 2014