BAYESIAN SINGLE-LEVEL BINOMIAL AND EXPONENTIAL RELIABILITY...

International Journal of Reliability Quality and Safety Engineering 1999 / 06 Vol. 6; Iss. 2

BAYESIAN SINGLE-LEVEL BINOMIAL AND EXPONENTIAL RELIABILITY DEMONSTRATION TEST PLANS

FITZGERALD, MARK, MARTZ, HARRY F., PARKER, ROBERT L.
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Volume:
6
Language:
english
Journal:
International Journal of Reliability, Quality and Safety Engineering
DOI:
10.1142/S0218539399000139
Date:
June, 1999
File:
PDF, 787 KB
english, 1999
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