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THE RELATIONSHIP BETWEEN REFLECTANCE ANISOTROPY AND ELECTRON DIFFRACTION IN THE DETECTION OF RECONSTRUCTION CHANGES OCCURRING AT III-V SEMICONDUCTOR SURFACES
ARMSTRONG, S.R., PEMBLE, M.E., TAYLOR, A.G., TURNER, A.R., FAWCETTE, P.N., JOYCE, B.A., NEAVE, J.H., ZHANG, J.Volume:
1
Journal:
Surface Review and Letters
DOI:
10.1142/S0218625X94000497
Date:
December, 1994
File:
PDF, 291 KB
1994