Local Diagonal Extrema Pattern: A New and Efficient Feature Descriptor for CT Image Retrieval
Dubey, Shiv Ram, Singh, Satish Kumar, Singh, Rajat KumarVolume:
22
Language:
english
Journal:
IEEE Signal Processing Letters
DOI:
10.1109/lsp.2015.2392623
Date:
September, 2015
File:
PDF, 1.32 MB
english, 2015