Scanning Transmission Electron Microscopy (STEM) Study of...

Japanese Journal of Applied Physics 1999 / 1 Vol. 38; Iss. Part 1, No

Scanning Transmission Electron Microscopy (STEM) Study of InAs/GaAs Quantum Dots

Murray, Ray, Malik, Surama, Siverns, Philip, Childs, David, Roberts, Christine, Joyce, Bruce, Davock, Helen
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Volume:
38
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.38.496
Date:
January, 1999
File:
PDF, 167 KB
english, 1999
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