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Multimodal microscopy using ‘half and half’ contact mode and ultrasonic force microscopy
Skilbeck, M S, Marsden, A J, Cao, G, Kinloch, I A, Young, R J, Edwards, R S, Wilson, N RVolume:
25
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/25/33/335708
Date:
August, 2014
File:
PDF, 1.62 MB
english, 2014