Neural network based modeling of PL intensity in PLD-grown...

Journal of Materials Processing Technology 2005 Vol. 159; Iss. 2

Neural network based modeling of PL intensity in PLD-grown ZnO thin films

Young-Don Ko, Hong Seong Kang, Min-Chang Jeong, Sang Yeol Lee, Jae-Min Myoung, Ilgu Yun
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Volume:
159
Year:
2005
Language:
english
Pages:
5
DOI:
10.1016/j.jmatprotec.2004.05.002
File:
PDF, 194 KB
english, 2005
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