Electron Tunneling Through an Al 2 O 3 Thin Film on NiAl(110) in Scanning Tunneling Microscopy
Iwasaki, Hiroshi, Sudoh, KoichiVolume:
41
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/jjap.41.7496
Date:
December, 2002
File:
PDF, 182 KB
english, 2002