Al-based anodic oxide films structure observation using...

Journal of Materials Processing Technology 2006 Vol. 172; Iss. 1

Al-based anodic oxide films structure observation using field emission gun scanning electron microscopy

N.N. Regone, C.M.A. Freire, M. Ballester
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Volume:
172
Year:
2006
Language:
english
Pages:
6
DOI:
10.1016/j.jmatprotec.2005.09.005
File:
PDF, 595 KB
english, 2006
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