In situ nanomanipulation system for electrical measurements in SEM
Noyong, Michael, Blech, Kerstin, Rosenberger, Andreas, Klocke, Volker, Simon, UlrichVolume:
18
Language:
english
Journal:
Measurement Science and Technology
DOI:
10.1088/0957-0233/18/12/n02
Date:
December, 2007
File:
PDF, 648 KB
english, 2007