AN EFFICIENT TEST PROCEDURE FOR FUNCTIONAL FAULTS IN...

Journal of Circuits System and Computers 1991 / 06 Vol. 1; Iss. 2

AN EFFICIENT TEST PROCEDURE FOR FUNCTIONAL FAULTS IN SEMICONDUCTOR RANDOM ACCESS MEMORIES

KIM, YUN-HONG, HONG, IN-SIK, JUNG, JUN-MO, KIM, YOUNG-OO, LIM, IN-CHIL
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Volume:
1
Language:
english
Journal:
Journal of Circuits, Systems and Computers
DOI:
10.1142/S0218126691000069
Date:
June, 1991
File:
PDF, 366 KB
english, 1991
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