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Oxidation resistance of Mo(Si 1−x Al x ) 2 nanocrystalline films and characterization of their oxide scales by electrochemical impedance spectroscopy
Xu, Jiang, Li, ZhengYang, Munroe, Paul, Xie, Zong-HanVolume:
4
Language:
english
Journal:
RSC Adv.
DOI:
10.1039/c4ra10570b
Date:
October, 2014
File:
PDF, 4.73 MB
english, 2014