In-situ transmission electron microscopy studies of the interaction between dislocations in strained SiGe/Si (001) heterostructures
Stach, E. A., Hull, R., Tromp, R. M., Ross, F. M., Reuter, M. C., Bean, J. C.Volume:
80
Language:
english
Journal:
Philosophical Magazine A
DOI:
10.1080/01418610008212156
Date:
September, 2000
File:
PDF, 6.43 MB
english, 2000