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Flight Test Comparison of Two Electron Attachment Techniques
Hayes, D. T., Herskovitz, S. B., Lennon, J. F., Poirier, J. L.Volume:
12
Language:
english
Journal:
Journal of Spacecraft and Rockets
DOI:
10.2514/3.57011
Date:
September, 1975
File:
PDF, 177 KB
english, 1975