![](/img/cover-not-exists.png)
[IEEE 2014 IEEE 12th International Conference on Solid -State and Integrated Circuit Technology (ICSICT) - Guilin, China (2014.10.28-2014.10.31)] 2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - The role of dianglin bonds in resistance switching behaviors of SiOx - Based RRAM
Chen, Kunji, Wang, Yuefei, Fang, Zhonghui, Li, Wei, Xu, Jun, Huang, XinfanYear:
2014
Language:
english
DOI:
10.1109/icsict.2014.7021485
File:
PDF, 761 KB
english, 2014