EFFECT OF THE ANNEALING TEMPERATURE ON THE ELECTRONIC AND...

Surface Review and Letters 2002 / 02 Vol. 9; Iss. 1

EFFECT OF THE ANNEALING TEMPERATURE ON THE ELECTRONIC AND ATOMIC STRUCTURES OF EXCHANGE-BIASED NiFe–FeMn BILAYERS

LEE, J. M., JAN, J. C., CHIOU, J. W., PONG, W. F., TSAI, M.-H., CHANG, Y. K., CHEN, Y. Y., WANG, C. R., LEE, J. F., YANG, T., LU, Z., LAI, W. Y., MAI, Z. H.
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Volume:
9
Language:
english
Journal:
Surface Review and Letters
DOI:
10.1142/S0218625X0200221X
Date:
February, 2002
File:
PDF, 273 KB
english, 2002
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