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Quantitative depth profiling of Ce 3+ in Pt/CeO 2 by in situ high-energy XPS in a hydrogen atmosphere
Kato, Shunsuke, Ammann, Markus, Huthwelker, Thomas, Paun, Cristina, Lampimäki, Markus, Lee, Ming-Tao, Rothensteiner, Matthäus, van Bokhoven, Jeroen A.Volume:
17
Year:
2015
Language:
english
Journal:
Phys. Chem. Chem. Phys.
DOI:
10.1039/C4CP05643D
File:
PDF, 2.07 MB
english, 2015