Enhancement of exchange bias in thin PtMn antiferromagnets...

Enhancement of exchange bias in thin PtMn antiferromagnets by Ru and Cr nano-lamination

Chih-Ling Lee, Jacques Kools, Adrian J. Devasahayam, Ming Mao, Chih-Ching Hu
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Volume:
286
Year:
2005
Language:
english
Pages:
6
DOI:
10.1016/j.jmmm.2004.09.040
File:
PDF, 274 KB
english, 2005
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