ULTRAHIGH VACUUM ATOMIC FORCE MICROSCOPY: TRUE ATOMIC...

Surface Review and Letters 1997 / 10 Vol. 4; Iss. 5

ULTRAHIGH VACUUM ATOMIC FORCE MICROSCOPY: TRUE ATOMIC RESOLUTION

LÜTHI, R., MEYER, E., BAMMERLIN, M., BARATOFF, A., HOWALD, L., GERBER, CH., GÜNTHERODT, H.-J.
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Volume:
4
Journal:
Surface Review and Letters
DOI:
10.1142/S0218625X9700122X
Date:
October, 1997
File:
PDF, 3.76 MB
1997
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