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[IEEE Comput. Soc Seventh Asian Test Symposium (ATS'98) - Singapore (2-4 Dec. 1998)] Proceedings Seventh Asian Test Symposium (ATS'98) (Cat. No.98TB100259) - March PS(23N) test for DRAM pattern-sensitive faults
Yarmolik, V., Klimets, Yu., Demidenko, S.Year:
1998
Language:
english
DOI:
10.1109/ats.1998.741638
File:
PDF, 407 KB
english, 1998