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[IEEE 2010 International Conference on Measuring Technology and Mechatronics Automation (ICMTMA 2010) - Changsha City, China (2010.03.13-2010.03.14)] 2010 International Conference on Measuring Technology and Mechatronics Automation - Effects of Cr-Mo Infiltration Source Structure on the Thickness of Alloy Layer by Double Glow Plasma Surface Metallurgy Technology
Xu, Jinyong, Zhang, Jingchun, Liu, Yajuan, Gao, ChengYear:
2010
Language:
english
DOI:
10.1109/ICMTMA.2010.504
File:
PDF, 246 KB
english, 2010