Annealing behaviour of defects in neutron transmutation doped silicon
Meng, X. T., Charalambous, Stef., Chardalas, M., Dedoussis, Sp., Eleftheriadis, C. A., Liolios, A. K.Volume:
133
Language:
english
Journal:
Radiation Effects and Defects in Solids
DOI:
10.1080/10420159508225761
Date:
March, 1995
File:
PDF, 255 KB
english, 1995