In situ spectroscopic ellipsometry to monitor surface...

In situ spectroscopic ellipsometry to monitor surface plasmon resonant group-III metals deposited by molecular beam epitaxy

P. C. Wu, M. Losurdo, T. Kim, S. Choi, G. Bruno, A. S. Brown
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Volume:
25
Year:
2007
Language:
english
DOI:
10.1116/1.2734163
File:
PDF, 847 KB
english, 2007
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