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[IEEE 17th IEEE Instrumentation and Measurement Technology Conference - Baltimore, MD, USA (1-4 May 2000)] Proceedings of the 17th IEEE Instrumentation and Measurement Technology Conference [Cat. No. 00CH37066] - Test and comparison of LVDT signal conditioner performance
Weissbach, R.S., Loker, D.R., Ford, R.M.Volume:
2
Year:
2000
Language:
english
DOI:
10.1109/imtc.2000.848941
File:
PDF, 302 KB
english, 2000