An experimental study of data retention behavior in modern...

ACM SIGARCH Computer Architecture News 2013 / 07 Vol. 41; Iss. 3

An experimental study of data retention behavior in modern DRAM devices

Liu, Jamie, Jaiyen, Ben, Kim, Yoongu, Wilkerson, Chris, Mutlu, Onur
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Volume:
41
Language:
english
Journal:
ACM SIGARCH Computer Architecture News
DOI:
10.1145/2508148.2485928
Date:
July, 2013
File:
PDF, 752 KB
english, 2013
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