![](/img/cover-not-exists.png)
Ultrafast random-access scanning in two-photon microscopy using acousto-optic deflectors
R. Salomé, Y. Kremer, S. Dieudonné, J.-F. Léger, O. Krichevsky, C. Wyart, D. Chatenay, L. BourdieuVolume:
154
Year:
2006
Language:
english
Pages:
14
DOI:
10.1016/j.jneumeth.2005.12.010
File:
PDF, 739 KB
english, 2006