Ultrafast random-access scanning in two-photon microscopy...

Ultrafast random-access scanning in two-photon microscopy using acousto-optic deflectors

R. Salomé, Y. Kremer, S. Dieudonné, J.-F. Léger, O. Krichevsky, C. Wyart, D. Chatenay, L. Bourdieu
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Volume:
154
Year:
2006
Language:
english
Pages:
14
DOI:
10.1016/j.jneumeth.2005.12.010
File:
PDF, 739 KB
english, 2006
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