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FASTER: Fully Automated Statistical Thresholding for EEG artifact Rejection
H. Nolan, R. Whelan, R.B. ReillyVolume:
192
Year:
2010
Language:
english
Pages:
11
DOI:
10.1016/j.jneumeth.2010.07.015
File:
PDF, 1.53 MB
english, 2010