Rapid variation in epilayer threading dislocation density...

Philosophical Magazine Letters 1990 / 09 Vol. 62; Iss. 3

Rapid variation in epilayer threading dislocation density near x = 0·4 in Ge x Si 1−x on (100) Si

Kvam, Eric P.
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Volume:
62
Language:
english
Journal:
Philosophical Magazine Letters
DOI:
10.1080/09500839008215054
Date:
September, 1990
File:
PDF, 1.14 MB
english, 1990
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