Reliability Estimation and Failure Analysis of Multilayer...

Reliability Estimation and Failure Analysis of Multilayer Ceramic Chip Capacitors

Yang, Seok Jun, Kim, Jin Woo, Ryu, Dong Su, Kim, Myung Soo, Jang, Joong Soon
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Volume:
17
Language:
english
Journal:
International Journal of Modern Physics B
DOI:
10.1142/S0217979203018934
Date:
April, 2003
File:
PDF, 432 KB
english, 2003
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