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POST-ANNEALING EFFECTS ON THE STRUCTURAL, OPTICAL AND ELECTRICAL PROPERTIES OF ITO FILMS STUDIED BY SPECTROSCOPIC ELLIPSOMETRY
INRITSAPONG, Y., CHINDAUDOM, P., NUNTAWONG, N., PATTHANASETTHAKUL, V., HORPHATHUM, M., EIAMCHAI, P., POKAIPISIT, A., LIMSUWAN, P.Volume:
24
Language:
english
Journal:
Modern Physics Letters B
DOI:
10.1142/S0217984910022652
Date:
March, 2010
File:
PDF, 651 KB
english, 2010