Efficient Error-Tolerability Testing on Image Processing...

Journal of Electronic Testing 2014 / 12 Vol. 30; Iss. 6

Efficient Error-Tolerability Testing on Image Processing Circuits Based on Equivalent Error Rate Transformation

Hsieh, Tong-Yu, Peng, Yi-Han, Li, Kuan-Hsien
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Volume:
30
Language:
english
Journal:
Journal of Electronic Testing
DOI:
10.1007/s10836-014-5488-y
Date:
December, 2014
File:
PDF, 3.44 MB
english, 2014
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