[IEEE 2014 International Conference on Applied Electronics (AE) - Pilsen, Czech Republic (2014.9.9-2014.9.10)] 2014 International Conference on Applied Electronics - 3D FEM simulation of small stripline for EMC testing
Zdenek, Kubik, Jiri, Skala, Nikolayev, DenysYear:
2014
Language:
english
DOI:
10.1109/ae.2014.7011691
File:
PDF, 402 KB
english, 2014