Capture efficiency for clustering reaction between charged defects in β-SiC
Y. Watanabe, K. Morishita, A. KohyamaVolume:
386-388
Year:
2009
Language:
english
Pages:
4
DOI:
10.1016/j.jnucmat.2008.12.098
File:
PDF, 315 KB
english, 2009