Recovery of neutron-induced damage of Si analyzed by thermal expansion measurement
Saishun Yamazaki, Katsumi Yoshida, Toyohiko YanoVolume:
386-388
Year:
2009
Language:
english
Pages:
5
DOI:
10.1016/j.jnucmat.2008.12.121
File:
PDF, 918 KB
english, 2009