Spetroscopic ellipsometry study on electrical and elemental...

Current Applied Physics 2015 / 04 Vol. 15; Iss. 4

Spetroscopic ellipsometry study on electrical and elemental properties of Sb-doped ZnO thin films

Pandey, Sushil Kumar, Awasthi, Vishnu, Verma, Shruti, Gupta, Mukul, Mukherjee, Shaibal
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Volume:
15
Language:
english
Journal:
Current Applied Physics
DOI:
10.1016/j.cap.2015.02.008
Date:
April, 2015
File:
PDF, 1.06 MB
english, 2015
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