X-RAY ABSORPTION SPECTROSCOPY STUDY OF THIN ZnO FILMS GROWN...

Surface Review and Letters 1997 / 02 Vol. 4; Iss. 1

X-RAY ABSORPTION SPECTROSCOPY STUDY OF THIN ZnO FILMS GROWN BY SINGLE SOURCE CVD ON Si(100)

KOCH, M. H., HARTMANN, A. J., LAMB, R. N., NEUBER, M., WALZ, J., GRUNZE, M.
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Volume:
4
Journal:
Surface Review and Letters
DOI:
10.1142/S0218625X97000079
Date:
February, 1997
File:
PDF, 344 KB
1997
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