The role of trace Ti concentration on the evolution of...

Vacuum 2015 / 05 Vol. 115

The role of trace Ti concentration on the evolution of microstructure and properties of duplex doped Ti(Ag)/DLC films

Ji, Li, Wu, Yanxia, Li, Hongxuan, Song, Hui, Liu, Xiaohong, Ye, Yinping, Chen, Jianmin, Zhou, Huidi, Liu, Liu
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Volume:
115
Language:
english
Journal:
Vacuum
DOI:
10.1016/j.vacuum.2015.01.023
Date:
May, 2015
File:
PDF, 2.41 MB
english, 2015
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