[IEEE 2014 East-West Design & Test Symposium (EWDTS) - Kiev, Ukraine (2014.9.26-2014.9.29)] Proceedings of IEEE East-West Design & Test Symposium (EWDTS 2014) - An efficient signature loading mechanism for memory repair
Sargsyan, VrezhYear:
2014
Language:
english
DOI:
10.1109/EWDTS.2014.7027061
File:
PDF, 98 KB
english, 2014